support list *****
MyCAD
EDA
Semiconductor
Design Center
¼¿
·ÎÄÚ(ÁÖ)´Â MOSISÀÇ Çѱ¹°ø½Ä´ë¸®Á¡À¸·Î
MOSIS
(M.P.W)ÀÇ ¸ðµç Á¦Ç°À»
Çѱ¹³»¿¡ µ¶Á¡À¸·Î
°ø±ÞÇÒ ¼ö ÀÖ½À´Ï´Ù.
±â¾÷ü, ¿¬±¸¼Ò, ´ëÇб³¿¡¼ Àú·ÅÇÏ°í ºü¸£°Ô ¼Ò·®ÀÇ Chip Á¦ÀÛ¸¦ ¿øÇÏ´Â ºÐ.
¿¬±¸ °³¹ß¿ëÀ¸·Î »õ·Î¿î
±â´É¡¤¼º´ÉÀÇ È¸·Î, ÀúÀü·Â ȸ·Î, °í¼Ó ȸ·ÎµîÀ» ¼³°è¡¤Á¦ÀÛ
ÇϰíÀÚ ÇÏ´Â ºÐ.
±¹³» ÁÖ¿ä Customer
- ETRI, KETI, KERI, KRISS, »ï¼º, LG,
¼¿ï´ë, KAIST, ¿¬¼¼´ë, ¼°´ë, ÀÎÇÏ´ë
°í·Á´ë, ÇѾç´ë, °æÈñ´ë,
Æ÷Ç×°ø´ë, ±¤¿î´ë, ±¤ÁÖ°ú±â¿ø,
MOSIS Fabrication
Processes
IBM Fabrication Processes
IBM SiGe
BiCMOS Processes
Feature
Size
Process
Name
CMOS
Vdd[V]
SiGe
Ft [GHz] | BVceo(1) [V]
Description
High Performance
High Breakdown
0.13 µm
8HP
1.2
2.5
3.3
200 | 1.77
57 | 3.55
5th
generation SiGe technology for advanced RADAR and mmWave applications.
8WL
1.2
2.5
3.3
103 | 2.4
54 | 4.7
Reduced
performance, cost effective technology for wireless applications.
0.18 µm
7HP
1.8
2.5
3.3
120 | 2.0
20 | 4.75
4th
generation SiGe technology best suited for wireless and high-speed
switches.
7WL
1.8
2.5
3.3
60 | 3.3
29 | 6.0
Reduced
performance, yet most cost effective SiGe technology offered.
0.25 µm
6HP/6DM
2.5
3.3
47 | 3.3
27 | 5.7
3rd
generation SiGe technology.
6WL
2.5
3.3
60 | 3.2
29 | 6.0
A
descendant of 7WL, it integrates 0.25 µm CMOS with the 7WL
SiGe NPN.
0.35 µm
5HPE
3.3
5.0
43 | 3.3
19 | 9.6
2nd
generation SiGe technology with 0.35 µm CMOS and
0.5 µm SiGe NPN's.
5PAe
3.3
5.0
35 | 5.5
25 | 7.5
Intended
for power amplifier applications, this process features Through Wafer
Vias.
0.50 µm
5HP
3.3
51 | 3.3
27 | 5.5
1st
generation SiGe technology.
5AM
3.3
51 | 3.3
27 | 5.5
Similar
to 5HP, but adds a thick top metal.
5DM
3.3
51 | 3.3
27 | 5.5
Similar
to 5HP but adds two thick top metals for high-Q inductors.
5PA
3.3
51 | 3.3
24 | 7.0
Similar
to 5AM, this process adds higher voltage NPN's for power amplifier
applications.
A
process comparison including Ft and Fmax can be found at the IBM BiCMOS Key
Technology Specifications
page.
(1) BVceo is not a
voltage limit for biasing unless the NPN is operating under a forced Ib
condition. Vce greater than BVceo is allowed for other bias
configurations, lower base impedance leading to higher voltage limits.
IBM CMOS and IBM RF CMOS Processes
Feature Size
Process Name
Voltage (V)
Core | I/O
Description
45
nm
12SOI
1.0 | 0.9
This
energy-saving SOI process is suitable for a broader range of consumer
electronics, including digital TVs and high-end mobile applications.
65
nm
10SF
1.0 | 1.8, 2.5
Excellent
for consumer electronics, wireless communications, and other
applications requiring high performance or system-on-a-chip.
10LPe/RFe
1.2
| 2.5
Tailored
for power-sensitive applications in wireless communications and
consumer electronics.
90
nm
9SF
1.0
| 2.5
Ideal
for leading-edge microprocessors, communications, and computer data
processing applications.
9LP/RF
1.2
| 2.5
Use
for low-cost, high performance wireless applications, as Bluetooth,
WLAN, cellular handsets, mobile TV, WiMax, UWB and GPS.
130
nm
8RF-DM
1.2
| 2.5
Use
for low-cost, high performance wireless applications as Bluetooth,
WLAN, cellular handsets and GPS.
8RF-LM
1.2
| 2.5
Similar
to 8RF-DM, but uses LM top metal.
180
nm
7SF
1.8
| 3.3
Use
for high-performance graphics, communications, and data processing
applications.
7RF
1.8
| 3.3
Ideally
suited for RF and wireless applications, as Bluetooth, LANs, cellular
phones and RF identification tags.
7RF SOI
1.8
| 3.3
Optimized
for RF switch applications, integrate multiple analog functions into
single-chip solutions for mobile devices.
250
nm
6RF
2.5
| 3.3
This
RF CMOS process is adapted for high frequency applications with a
variety of passives (as high Q inductors, MIM and MOS capacitors, and
MOS varactors) for mixed-signal and RF applications.
2011
IBM Fabrication Schedule º¸±â
MOSIS IBM University Program
IBM
University Program
Min.
Size
Price
IBM
180nm SiGe (7WL)
4mm 2
¾Æ·¡ ¿¬¶ôó·Î
º°µµ ¹®ÀÇ
IBM
130nm CMOS(8RF-DM)
4mm 2
IBM
90nm CMOS(9RF/9LP)
4mm 2
*
»ó±â ¸éÀûº¸´Ù Å©°Ô Á¦ÀÛ °¡´É ÇÕ´Ï´Ù.
*
02-3433-0020 / mosis-korea@mosis.com
TSMC
Fabrication Processes
Feature
Size
Process
Description
40
nm
Low-power
logic
65 nm
Standard
logic, RPO
Mixed-mode/RF,
RPO, MiM
90 nm
Standard
logic, RPO
Mixed-mode/RF,
RPO, MiM
0.13
µm
CL013G
Standard
logic, RPO
CR013G (CM013)
Mixed-mode,
RPO, MiM
CL013LP
Low-power
logic, RPO
CL013LV
Low-voltage
logic, RPO
0.18
µm
CL018
Standard
logic, RPO
CR018 (CM018)
Mixed-mode/RF,
RPO, MiM
CL018LP
Low-power
logic, RPO
CL018LV
Low-voltage
logic, RPO
CL018HV
High-voltage,
RPO
0.25
µm
CL025
Standard
logic, RPO
CR025 (CM025)
Mixed-mode/RF,
RPO, MiM
0.35
µm
CL035
Standard
logic, 5.0 V ESD, RPO
CM035
Mixed-mode/RF,
5.0 V ESD, PiP, 2-poly
CL035HV 1
High-voltage,
RPO
1
The TSMC 0.35 µm HV DDD process uses Ar anneal wafers (argon annealed
wafers); the BCD process uses Hi-Wafer (hydrogen annealed wafer).
These
processes use non-epitaxial wafers. Epitaxial wafers are available at
an additional cost. Specify "epitaxial wafers" in the
"Options" section of the Request
for Custom Quote form for pricing. To order epitaxial wafers,
submit the Request for Custom Quote and select the epitaxial
fabrication option from either the New
Project , Fabricate ,
or Update
form.
2011
TSMC Fabrication Schedule º¸±â
On Semiconductor Fabrication Processes
(formerly AMIS)
Feature
Size
Metal
Voltage
Description
0.35
4
4
4
3.3
3.3
3.3,
2.5, 1.8, or 1.2
Mixed-Mode,
I3T80
Mixed-Mode, I3T50
Mixed-Mode, I3T25
0.50
3
5
Mixed-Mode,
C5
0.70
3
2
5
5
Mixed-Mode,
I2T100
Mixed-Mode, I2T30
austriamicrosystems Fabrication Processes
Feature
Size
Metal
Voltage
Description
0.18
6
1.8/3.3
CMOS C18
1.8 V,
5 V, 20 V, and 50 V devices on a single chip
HV-CMOS H18
0.35
4
3.3/5
CMOS, 2-poly, C35B4C3
3.3/5
CMOS-Opto, 2-poly, C35B4O1
3.3/5
CMOS, Thick Metal,
MiM, C35B4M3
50
HV-CMOS, High resistive
poly, H35B4D3
See
Compare AMS 0.35 µm
CMOS Processes
0.35
4
2.5
SiGe BiCMOS, MiM capacitor,
and high resistive poly, S35D4
0.80
2
50
HV-CMOS, 3-poly, high
resistance, vertical NPN, CXZ
To be considered ontime for
an MPW run, layout and paperwork are due to MOSIS by 1 PM PT
(Pacific/California Time) on the date listed.